A cryoFIBSEM is a high-resolution scanning electron microscope equipped with a focused ion beam (FIB) column and a cryo-observation stage. In addition to being a conventional SEM, samples can be imaged in 3D to obtain high-resolution volumes (3nm voxel) after abrasion using the FIB beam, with or without correlative microscopy. It is also possible to generate these volumes from vitrified samples and capture the 3D ultrastructure in a state close to its native state. In addition, soft materials such as polymers, biological samples, and many other systems can deform, melt, or become amorphous under FIB milling and SEM imaging conditions at room temperature. Thanks to cryo-FIB/SEM, the sample is cooled to cryogenic temperatures (-130°C) in order to minimize these artifacts. This allows FIB cross-sections and SEM images to be produced with +/- chemical analysis of beam-sensitive materials, with minimal deformation. Finally, this technology enables, among other things, the preparation of cryogenic FIB lamellae for cryo-MET analysis.

The aim of this presentation will be to introduce this comprehensive, innovative new electron microscopy equipment, which is new to Bordeaux and the surrounding region. Thus, initially, the context in which this purchase is being made and the technological aspects will be explained. Next, and most importantly, the various possible applications will be presented in the form of concrete examples. We will conclude with a discussion.